Danvers, Massachusetts
United States
2
2024-08-29
The entities that hold a legal rights for patent applications filed by inventor Sauer Jeffrey:
Jeffrey Sauer from Danvers, US has applied for patents for these inventions. The list has both pending applications and granted patents:
System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles
#2 | 2023-12-14GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT A SAMPLE BY USE OF CHARGED PARTICLES AND INSPECTION SYSTEM HAVING SUCH GAS INJECTION SUBSYSTEM
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