Stephan Weiss

City:

Rodgau

Country:

Germany

Published Applications:

Last publication date:

2025-06-19

Top Assignees for applications by Stephan Weiss

The entities that hold a legal rights for patent applications filed by inventor Weiss Stephan:

Stephan Weiss from Rodgau, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

DEVICE AND METHOD FOR MEASURING WAFERS

Device and Method for Measuring Wafers

APPARATUS AND METHOD FOR MEASURING WAFERS

METHOD AND DEVICE FOR MEASURING OPTICAL THICKNESS

Device and method for measuring wafers

CHROMATIC CONFOCAL MEASURING SYSTEM FOR HIGH-SPEED DISTANCE MEASUREMENT

CHROMATIC CONFOCAL MEASURING DEVICE

InventorID:

5947599 ⎘