Evan W. Wang

City:

Stanford, California

Country:

United States

Published Applications:

Last publication date:

2024-01-18

Top Assignees for applications by Evan W. Wang

The entities that hold a legal rights for patent applications filed by inventor Wang Evan W.:

Evan W. Wang from Stanford, US has applied for patents for these inventions. The list has both pending applications and granted patents:

METASURFACE POLARIZATION FILTERING FOR CHARACTERIZATION OF SAMPLES

MATRIX-BASED CHARACTERIZATION AND MEASUREMENTS FOR SEMICONDUCTOR THIN-FILM MATERIAL

InventorID:

5954869 ⎘