Carmel Yehuda DRILLMAN

City:

Haifa

Country:

Israel

Published Applications:

Last publication date:

2025-09-18

Top Assignees for applications by Carmel Yehuda DRILLMAN

The entities that hold a legal rights for patent applications filed by inventor DRILLMAN Carmel Yehuda:

CAMTEK LTD. 4 Migdal Haemek, Israel

Recent patent applications by DRILLMAN Carmel Yehuda

Carmel Yehuda DRILLMAN from Haifa, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-09-18

US20250290869A1

Physics

SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSPECTION

#2 | 2024-10-24

US20240355083A1

Physics

Inspection system for edge and bevel inspection of semiconductor structures

#3 | 2024-03-12

US18220972

Physics

Semiconductor edge and bevel inspection tool system

#4 | 2024-01-04

US20240003826A1

Physics

Semiconductor inspection tool system and method for wafer edge inspection

#5 | 2023-11-28

US18080006

Physics

Semiconductor inspection tool system and method for wafer edge inspection

InventorID:

5954875 ⎘