Baheej BATHISH

City:

Haifa

Country:

Israel

Published Applications:

Last publication date:

2025-09-18

Top Assignees for applications by Baheej BATHISH

The entities that hold a legal rights for patent applications filed by inventor BATHISH Baheej:

Baheej BATHISH from Haifa, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSPECTION

Semiconductor inspection tool system and method for wafer edge inspection

Semiconductor inspection tool system and method for wafer edge inspection

InventorID:

5954877 ⎘