Inventor profile of:

Yayi Wei

City:

Beijing

Country:

China

Published Applications:

15

Last publication date:

2026-05-28

Top Assignees for applications by Yayi Wei

The entities that hold a legal rights for patent applications filed by inventor Wei Yayi:

Recent patent applications by Wei Yayi

Yayi Wei from Beijing, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-05-28
US20260150634A1
Electricity

HARD MASK STRUCTURE FOR INTEGRATED CIRCUIT MANUFACTURING, AND METHOD FOR MANUFACTURING INTEGRATED CIRCUIT DEVICE

#2 | 2026-05-28
US20260148930A1
Electricity

METHOD AND APPARATUS FOR ELECTRON BEAM EXPOSURE

#3 | 2026-05-07
US20260126732A1
Physics

METHOD AND APPARATUS FOR DETERMINING PROCESS WINDOW, AND COMPUTER DEVICE

#4 | 2026-04-30
US20260118786A1
Physics

METHOD AND STRUCTURE FOR LITHOGRAPHY ALIGNMENT

#5 | 2026-04-30
US20260118773A1
Physics

SELF-EXCITATION LITHOGRAPHY METHOD WITH SELF-ALIGNMENT EFFECT

#6 | 2026-04-02
US20260094000A1
Physics

METHOD FOR CONSTRUCTING CONDITIONAL TEST LAYOUT GENERATOR

#7 | 2025-12-18
US20250383607A1
Physics

METHOD AND APPARATUS FOR TRAINING ON IMAGING OF PLASMA LITHOGRAPHY

#8 | 2025-07-10
US20250224684A1
Physics

ANALYTIC METHOD AND DEVICE FOR QUANTITATIVELY CALCULATING LINE EDGE ROUGHNESS IN PLASMA ULTRA-DIFFRACTION PHOTOETCHING PROCESS

#9 | 2024-10-17
US20240345488A1
Physics

OPTICAL METHOD AND APPARATUS FOR QUICKLY REALIZING PRECISE CALIBRATION OF LITHOGRAPHY SYSTEM

#10 | 2024-06-06
US20240184217A1
Physics

METHOD AND APPARATUS FOR CORRECTING PROXIMITY EFFECT OF ELECTRON BEAM

#11 | 2024-05-30
US20240176228A1
Physics

Method and device for optimizing mask parameters

#12 | 2024-03-07
US20240077799A1
Physics

METHOD FOR CORRECTING LITHOGRAPHY PATTERN OF SURFACE PLASMA

#13 | 2024-02-15
US20240055254A1
Electricity

Method for manufacturing semiconductor device

#14 | 2024-02-01
US20240038584A1
Electricity

Method for manufacturing semiconductor device

#15 | 2024-01-04
US20240005064A1
Physics

METHOD AND APPARATUS FOR OPTIMIZING LITHOGRAPHY QUALITY, ELECTRONIC DEVICE, MEDIUM AND PROGRAM PRODUCT

InventorID:

5955907 ⎘