San Jose, California
United States
22
2020-12-17
The entities that hold a legal rights for patent applications filed by inventor Petruno Patrick T.:
Patrick T. Petruno from San Jose, US has applied for patents for these inventions. The list has both pending applications and granted patents:
ASSAY TEST STRIPS WITH MULTIPLE LABELS AND READING SAME
#2 | 2019-05-23Diagnostic test system using measurement obtained from reference feature to modify operational parameter of reader
#3 | 2017-07-13Methods and systems for calibrating illumination source of diagnostic test system
#4 | 2016-10-27Lateral flow assay systems and methods
#5 | 2014-01-02Lateral flow assay systems and methods
#6 | 2012-05-24Lateral flow assay systems and methods
#7 | 2009-08-27Assay test strips with multiple labels and reading same
#8 | 2009-07-16Assay test strips with multiple labels and reading same
#9 | 2009-07-16Assay test strips with multiple labels and reading same
#10 | 2009-07-16ASSAY TEST STRIPS AND READING SAME
#11 | 2009-07-16Assay test strips and reading same
#12 | 2009-07-16ASSAY TEST STRIPS AND READING SAME
#13 | 2008-01-31End-of-life disabling of a diagnostic test system
#14 | 2007-10-04Assay test strips with multiple labels and reading same
#15 | 2007-08-09INDICATING STATUS OF A DIAGNOSTIC TEST SYSTEM
#16 | 2007-06-21Diagnostic test reader with disabling unit
#17 | 2006-10-26Assay test strips and reading same
#18 | 2006-10-26Lateral flow assay systems and methods
#19 | 2006-06-15Diagnostic test using gated measurement of fluorescence from quantum dots
#20 | 2006-06-08Read-write assay system
#21 | 2005-10-06Optoelectronic rapid diagnostic test system
#22 | 2005-10-06Optoelectronic rapid diagnostic test system
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