Hideo Toraya

City:

Akishima

Country:

Japan

Published Applications:

Last publication date:

2024-05-23

Top Assignees for applications by Hideo Toraya

The entities that hold a legal rights for patent applications filed by inventor Toraya Hideo:

RIGAKU CORPORATION 4 Tokyo, Japan
RIGAKU CORPORATION 1 Akishima, Japan

Recent patent applications by Toraya Hideo

Hideo Toraya from Akishima, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-05-23

US20240167969A1

Physics

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLINITY MEASUREMENT METHOD, AND INFORMATION STORAGE MEDIUM

#2 | 2023-09-07

US20230280290A1

Physics

Device and method for analyzing diffraction pattern of mixture, and information storage medium

#3 | 2022-12-08

US20220390392A1

Physics

Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium

#4 | 2022-06-16

US20220187225A1

Physics

Method and device for analyzing diffraction pattern of mixture, and information storage medium

#5 | 2021-01-21

US20210018452A1

Physics

Quantitative phase analysis device for analyzing non-crystalline phases, quantitative phase analysis method for analyzing Non-Crystalline phases, and non-transitory computer-readable storage medium storing quantitative phase analysis program for analyzing Non-Crystalline Phases

InventorID:

6051175 ⎘