Tokyo
Japan
22
2025-07-17
The entities that hold a legal rights for patent applications filed by inventor Ohashi Takeyoshi:
Takeyoshi Ohashi from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD
#2 | 2024-11-07Charged Particle Beam System
#3 | 2023-12-21Charged Particle Beam Apparatus
#4 | 2022-11-03Charged particle beam system
#5 | 2021-12-09Electron microscope and method of adjusting focus of electron microscope
#6 | 2021-02-11Scanning electron microscope and method for measuring pattern
#7 | 2020-07-09Image processing device, image processing method and charged particle microscope
#8 | 2019-08-08Inspection system, image processing device and inspection method
#9 | 2019-07-11Charged particle beam device and aberration correction method for charged particle beam device
#10 | 2018-07-05Aberration correction method, aberration correction system, and charged particle beam apparatus
#11 | 2017-01-19Scanning electron microscope
#12 | 2015-12-03Charged-particle beam device
#13 | 2015-09-03Aberration corrector and charged particle beam apparatus using the same
#14 | 2015-04-23Measurement method, image processing device, and charged particle beam apparatus
#15 | 2015-02-05Method for estimating shape before shrink and CD-SEM apparatus
#16 | 2015-02-05Electron beam equipment
#17 | 2014-09-04Measuring method, data processing apparatus and electron microscope using same
#18 | 2013-10-17Electron beam device
#19 | 2013-07-11Scanning electron microscope
#20 | 2013-01-31Pattern evaluation method, device therefor, and electron beam device
#21 | 2012-11-15Charged particle instrument
#22 | 2012-11-15Scanning electron microscope and inspection method using same
60740 ⎘