Hideyuki Ichihara

City:

Hiroshima

Country:

Japan

Published Applications:

Last publication date:

2007-03-29

Top Assignees for applications by Hideyuki Ichihara

The entities that hold a legal rights for patent applications filed by inventor Ichihara Hideyuki:

Sharp Kabushiki Kaisha 2 Osaka, Japan

Recent patent applications by Ichihara Hideyuki

Hideyuki Ichihara from Hiroshima, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2007-03-29

US20070071304A1

Physics

Defect detecting device, image sensor device, image sensor module, image processing device, digital image quality tester, and defect detecting method

#2 | 2006-05-09

US10668370

Logic circuit test apparatus and logic circuit test method

InventorID:

6195898 ⎘