Akihiro Hino

City:

Tsukuba

Country:

Japan

Published Applications:

Last publication date:

2012-02-16

Top Assignees for applications by Akihiro Hino

The entities that hold a legal rights for patent applications filed by inventor Hino Akihiro:

Akihiro Hino from Tsukuba, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for detecting and quantifying endogenous wheat DNA sequence

Method for detecting and quantifying endogenous wheat DNA sequence

Method for detecting and quantifying endogenous wheat DNA sequence

Method for detecting and quantifying endogenous wheat DNA sequence

Methods of quantitative detection of genetic recombinants and standard molecules for the methods

Method for detecting and quantifying endogenous wheat DNA sequence

InventorID:

6232085 ⎘