Hisashi Ode

City:

Chofu

Country:

Japan

Published Applications:

Last publication date:

2018-11-01

Top Assignees for applications by Hisashi Ode

The entities that hold a legal rights for patent applications filed by inventor Ode Hisashi:

Hisashi Ode from Chofu, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Sample shape measuring method and sample shape measuring apparatus

Sample shape measuring method and sample shape measuring apparatus

Fresnel optical element and optical system using the same

InventorID:

6254501 ⎘