Yuichi Ogawa

City:

Sendai

Country:

Japan

Published Applications:

Last publication date:

2012-06-07

Top Assignees for applications by Yuichi Ogawa

The entities that hold a legal rights for patent applications filed by inventor Ogawa Yuichi:

Yuichi Ogawa from Sendai, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for measurement of properties of analyte

Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring device

InventorID:

6264586 ⎘