Inventor profile of:

Chen Wang

City:

Tigard, Oregon

Country:

United States

Published Applications:

18

Last publication date:

2018-02-15

Top Assignees for applications by Chen Wang

The entities that hold a legal rights for patent applications filed by inventor Wang Chen:

Recent patent applications by Wang Chen

Chen Wang from Tigard, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2018-02-15
US20180045780A1
Physics

Timing-aware test generation and fault simulation

#2 | 2015-11-12
US20150323600A1
Physics

Timing-aware test generation and fault simulation

#3 | 2014-02-13
US20140047404A1
Physics

Timing-aware test generation and fault simulation

#4 | 2012-07-05
US20120174049A1
Physics

Timing-aware test generation and fault simulation

#5 | 2010-10-07
US20100257417A1
Physics

Compressing test responses using a compactor

#6 | 2009-10-01
US20090249147A1
Physics

Fault diagnosis of compressed test responses

#7 | 2009-07-16
US20090183128A1
Physics

Generating test patterns having enhanced coverage of untargeted defects

#8 | 2008-12-25
US20080320352A1
Physics

METHODS FOR DISTRIBUTION OF TEST GENERATION PROGRAMS

#9 | 2008-09-04
US20080216076A1
Physics

Methods for distributing programs for generating test data

#10 | 2008-06-05
US20080133987A1
Physics

Compressing test responses using a compactor

#11 | 2008-05-06
US10778950
-

Compressing test responses using a compactor

#12 | 2007-12-13
US20070288822A1
Physics

Timing-aware test generation and fault simulation

#13 | 2007-04-26
US20070094561A1
Physics

Methods for distribution of test generation programs

#14 | 2007-04-26
US20070094556A1
Physics

Methods for distributing programs for generating test data

#15 | 2006-02-23
US20060041814A1
Physics

Fault diagnosis of compressed test responses having one or more unknown states

#16 | 2006-02-23
US20060041813A1
Physics

Adaptive fault diagnosis of compressed test responses

#17 | 2006-02-23
US20060041812A1
Physics

Fault diagnosis of compressed test responses

#18 | 2005-10-27
US20050240887A1
Physics

Generating test patterns having enhanced coverage of untargeted defects

InventorID:

653655 ⎘