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Inventor profile of:

Yoel Feier

City:

Haifa

Country:

Israel

Published Applications:

1

Last publication date:

2022-12-29

Recent patent applications by Feier Yoel

Yoel Feier from Haifa, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-12-29

US20220413395A1

Overlay mark design for electron beam overlay

InventorID:

6566223 ⎘