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Inventor profile of:

Murchana Baruah

City:

Bothell, Washington

Country:

United States

Published Applications:

1

Last publication date:

2024-03-14

Recent patent applications by Baruah Murchana

Murchana Baruah from Bothell, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-03-14

US20240087687A1

SYSTEMS AND METHODS FOR ONTOLOGY MATCHING

InventorID:

6599230 ⎘