🔗 Permalink

Inventor profile of:

Sven Meyer

City:

Rauenberg

Country:

Germany

Published Applications:

1

Last publication date:

2024-07-18

Recent patent applications by Meyer Sven

Sven Meyer from Rauenberg, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-07-18

US20240242334A1

METHOD FOR DEFECT DETECTION IN A SEMICONDUCTOR SAMPLE IN SAMPLE IMAGES WITH DISTORTION

InventorID:

6725341 ⎘