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Inventor profile of:

Thomas C. Chust

City:

Muenchen

Country:

Germany

Published Applications:

1

Last publication date:

2024-07-18

Recent patent applications by Chust Thomas C.

Thomas C. Chust from Muenchen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-07-18

US20240242334A1

METHOD FOR DEFECT DETECTION IN A SEMICONDUCTOR SAMPLE IN SAMPLE IMAGES WITH DISTORTION

InventorID:

6725342 ⎘