Munich
Germany
8
2021-06-10
The entities that hold a legal rights for patent applications filed by inventor Ahmed Sherif Sayed:
Sherif Sayed Ahmed from Munich, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Measurement setup, reference reflector as well as method for measuring attenuation
#2 | 2020-02-13Method as well as system for determining the three-dimensional alignment of components of a radar system
#3 | 2016-07-28System and a method for the efficient scanning of objects
#4 | 2015-10-15Method and system for millimeter-wave image reconstruction
#5 | 2015-02-26Method and device for detecting structures in an object under investigation
#6 | 2014-09-04Method, system and calibration target for the automatic calibration of an imaging antenna array
#7 | 2014-03-06Printed-circuit board arrangement for millimeter-wave scanners
#8 | 2012-03-01Method for detecting a covered dielectric object
674560 ⎘