🔗 Permalink

Inventor profile of:

Maarten Kuijper

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2024-08-15

Top Assignees for applications by Maarten Kuijper

The entities that hold a legal rights for patent applications filed by inventor Kuijper Maarten:

Koninklijke Philips Electronics, N.V. 10 Eindhoven, Netherlands
FEI Company 8 Hillsboro, OR United States
Koninklijke Philips N.V. 2 Eindhoven, Netherlands
PHILIPS & LITE-ON DIGITAL SOLUTIONS CORPORATION 1 TAIPEI CITY, Taiwan
LITE-ON IT CORPORATION 1 TAIPEI CITY, Taiwan
LITE-ON IT CORPORATION 1 Taipei, Taiwan
PHILIPS & BENQ DIGITAL STORAGE CORPORATION 1 Taipei, Taiwan
Philips & Lite-On Digital Solutions Corporation 1 Taipei, Taiwan
Koninklijke Philips Electronic, N.V. 1 Eindhoven, Netherlands

Recent patent applications by Kuijper Maarten

Maarten Kuijper from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-08-15

US20240271850A1

Mechanical engineering

Method of preparing a cryogenic sample with improved cooling characteristic

#2 | 2024-05-09

US20240151615A1

Physics

METHOD OF PREPARING A CRYOGENIC SAMPLE WITH IMPROVED COOLING CHARACTERISTICS

#3 | 2022-12-29

US20220410615A1

Performing operations; transporting

BLOTTING MATERIAL WITH PROFILED REGION, METHOD OF MANUFACTURING SAME, AND USES THEREOF

#4 | 2022-10-06

US20220316784A1

Mechanical engineering

Method of preparing a cryogenic sample with improved cooling characteristic

#5 | 2021-08-19

US20210257183A1

Electricity

Device and method for determining a property of a sample that is to be used in a charged particle microscope

#6 | 2021-03-11

US20210072170A1

Physics

Methods and devices for preparing sample for cryogenic electron microscopy

#7 | 2020-05-07

US20200144022A1

Electricity

Diffraction pattern detection in a transmission charged particle microscope

#8 | 2019-11-07

US20190341243A1

Electricity

EELS detection technique in an electron microscope

#9 | 2014-03-06

US20140064054A1

Physics

Detection of data in burst cutting area of optical disk

#10 | 2012-11-01

US20120273676A1

Electricity

Determining a reconstructed image with viterbi detection using a particle-optical apparatus

#11 | 2011-03-31

US20110075533A1

Physics

Detection of data in burst cutting area of optical disk

#12 | 2010-06-24

US20100157764A1

Physics

Focus optimization routine with sub-optimal jump settings in optical disc systems

#13 | 2009-12-17

US20090310453A1

Physics

OPTICAL DRIVE AND READ POWER ESTIMATION METHOD

#14 | 2009-11-26

US20090290468A1

Physics

INFORMATION REPRODUCING METHOD

#15 | 2009-10-08

US20090252010A1

Physics

Optical disk drive with disk type determination and method of determining a disk type of an optical disk with an optical disk drive

#16 | 2009-10-08

US20090252008A1

Physics

Analysis of optical effects on storage medium

#17 | 2009-08-27

US20090213710A1

Physics

REPRODUCING INFORMATION FROM ANINFORMATION CARRIER

#18 | 2008-12-04

US20080298209A1

Physics

Focusing control method for reading/writing optical disc

#19 | 2008-09-11

US20080219131A1

Physics

Objective Lens

#20 | 2008-08-07

US20080186817A1

Physics

Method and apparatus for selecting an optimum write parameter, and optical recording medium for use by said method and apparatus

#21 | 2008-07-24

US20080175107A1

Physics

FOCUSING CONTROL METHOD FOR READING/WRITING OPTICAL DISC

#22 | 2008-01-17

US20080013416A1

Physics

Drive and method for determining the type of optical record carrier

#23 | 2007-03-29

US20070072123A1

Physics

Optical record carrier recording method, optical record carrier and apparatus for writing information

#24 | 2007-03-22

US20070067509A1

Physics

Detection of data in burst cutting areas of optical disk

#25 | 2006-10-26

US20060239132A1

Physics

Content identifiers for multilayered optical storage disks

InventorID:

674823 ⎘