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Inventor profile of:

Nir BenDavid

City:

Hod Hasharon

Country:

Israel

Published Applications:

2

Last publication date:

2025-05-29

Recent patent applications by BenDavid Nir

Nir BenDavid from Hod Hasharon, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-05-29

US20250172881A1

CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS

#2 | 2024-09-05

US20240295827A1

CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS

InventorID:

6769866 ⎘