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Inventor profile of:

Moritz Gronbach

City:

München

Country:

Germany

Published Applications:

1

Last publication date:

2024-10-24

Recent patent applications by Gronbach Moritz

Moritz Gronbach from München, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-10-24

US20240353473A1

Computer-Implemented Method for Determining a Quality State of a Wafer

InventorID:

6818316 ⎘