Keng Chai

City:

Stuttgart

Country:

Germany

Published Applications:

Last publication date:

2025-10-16

Recent patent applications by Chai Keng

Keng Chai from Stuttgart, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

METHOD AND DEVICE FOR CREATING A MASK FOR SEGMENTING AT LEAST ONE TEST IMAGE

Method and Apparatus for Calculating and Monitoring an Anomaly Score in Semiconductor Production

Method and Apparatus for Monitoring an Anomaly Score in Semiconductor Manufacturing

Method for Providing Wafer Test Data of at Least One Wafer with Semiconductor Chips

InventorID:

6839694 ⎘