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Inventor profile of:

Hajime SUGIMURA

City:

Tokyo

Country:

Japan

Published Applications:

1

Last publication date:

2024-11-28

Recent patent applications by SUGIMURA Hajime

Hajime SUGIMURA from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-11-28

US20240393389A1

SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESULT ANALYSIS METHOD, AND RECORDING MEDIUM

InventorID:

6851773 ⎘