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Inventor profile of:

Shu Hui HAM

City:

Volstroff

Country:

France

Published Applications:

1

Last publication date:

2025-02-06

Recent patent applications by HAM Shu Hui

Shu Hui HAM from Volstroff, FR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-02-06

US20250044077A1

METHOD FOR MEASURING THE THICKNESS OF A VARNISH LAYER

InventorID:

6921580 ⎘