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Inventor profile of:

Christian Sendner

City:

Munich

Country:

Germany

Published Applications:

1

Last publication date:

2025-03-13

Recent patent applications by Sendner Christian

Christian Sendner from Munich, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-03-13

US20250085234A1

USE OF LAYOUT ANALYSIS TO ENABLE EFFICIENT AND EFFECTIVE RANDOM DEFECT INSPECTION USING A VECTOR-MODE E-BEAM INSPECTION MACHINE

InventorID:

6956348 ⎘