Hang DU

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2025-03-20

Top Assignees for applications by Hang DU

The entities that hold a legal rights for patent applications filed by inventor DU Hang:

Hang DU from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

CHARGED PARTICLE BEAM INSPECTION SYSTEM AND CHARGED PARTICLE BEAM INSPECTION METHOD

InventorID:

6965357 ⎘