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Inventor profile of:

Nir Turko

City:

Yavne

Country:

Israel

Published Applications:

2

Last publication date:

2026-03-26

Recent patent applications by Turko Nir

Nir Turko from Yavne, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-03-26

US20260085923A1

HOLOGRAPHIC INSPECTION METHOD AND SYSTEM

#2 | 2025-05-08

US20250146964A1

THERMAL IMAGING METHOD FOR CRACK AND HOLE DETECTION IN SEMICONDUCTOR DEVICES

InventorID:

7010208 ⎘