Jonathan J. O'Hare

City:

Warwick, Rhode Island

Country:

United States

Published Applications:

Last publication date:

2016-03-31

Top Assignees for applications by Jonathan J. O'Hare

The entities that hold a legal rights for patent applications filed by inventor O'Hare Jonathan J.:

Jonathan J. O'Hare from Warwick, US has applied for patents for these inventions. The list has both pending applications and granted patents:

System and method for measuring an object using X-ray projections

Parametric control of object scanning

METHOD AND APPARATUS OF MEASURING OBJECTS USING SELECTIVE IMAGING

X-ray computed tomography device calibration and verification apparatus

Alignment, verification, and optimization of high power wireless charging systems

X-ray computed tomography device calibration and verification apparatus

Coordinate measuring system data reduction

InventorID:

70346 ⎘