Shichen Qu

City:

Beijing

Country:

China

Published Applications:

Last publication date:

2025-03-18

Top Assignees for applications by Shichen Qu

The entities that hold a legal rights for patent applications filed by inventor Qu Shichen:

Shichen Qu from Beijing, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for constructing defect detection model, method for detecting defect and related apparatus

InventorID:

7047561 ⎘