Inventor profile of:

Thomas DIETERLE

City:

Murrhardt

Country:

Germany

Published Applications:

9

Last publication date:

2026-06-04

Recent patent applications by DIETERLE Thomas

Thomas DIETERLE from Murrhardt, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-06-04
US20260155329A1
Electricity

PARTICLE-OPTICAL ARRANGEMENT, FOR EXAMPLE MULTI-BEAM PARTICLE MICROSCOPE, WITH A MAGNET ARRANGEMENT FOR SEPARATING A PRIMARY AND A SECONDARY PARTICLE-OPTICAL BEAM PATH WITH IMPROVED PERFORMANCE

#2 | 2026-05-28
US20260148923A1
Electricity

MULTI-BEAM PARTICLE BEAM SYSTEM HAVING AN ELECTROSTATIC BOOSTER LENS, METHOD FOR OPERATING A MULTI-BEAM PARTICLE BEAM SYSTEM, AND ASSOCIATED COMPUTER PROGRAM PRODUCT

#3 | 2026-04-02
US20260094783A1
Electricity

MULTIPLE PARTICLE BEAM SYSTEM, IN PARTICULAR MULTI-BEAM PARTICLE MICROSCOPE, HAVING A FAST MAGNETIC LENS AND THE USE THEREOF

#4 | 2025-12-04
US20250372343A1
Electricity

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ADAPTIVE DETECTION SYSTEM

#5 | 2025-11-13
US20250349500A1
Electricity

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH A DETECTION UNIT FOR FAST COMPENSATION OF CHARGING EFFECTS

#6 | 2025-11-06
US20250343025A1
Electricity

MULTI-BEAM PARTICLE MICROSCOPE WITH IMPROVED MULTI-BEAM GENERATOR FOR FIELD CURVATURE CORRECTION AND MULTI-BEAM GENERATOR

#7 | 2025-11-06
US20250343021A1
Electricity

FAST CLOSED-LOOP CONTROL OF MULTI-BEAM CHARGED PARTICLE SYSTEM

#8 | 2025-09-25
US20250299905A1
Electricity

MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH DETECTION SYSTEM FOR FAST CHARGE COMPENSATION

#9 | 2025-06-26
US20250210300A1
Electricity

PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MICROSCOPE, WITH A MAGNET ARRANGEMENT FOR SEPARATING A PRIMARY AND A SECONDARY PARTICLE-OPTICAL BEAM PATH

InventorID:

7106300 ⎘