Inventor profile of:

Tetsuya Matsui

City:

Hitachi

Country:

Japan

Published Applications:

23

Last publication date:

2019-06-27

Top Assignees for applications by Tetsuya Matsui

The entities that hold a legal rights for patent applications filed by inventor Matsui Tetsuya:

Recent patent applications by Matsui Tetsuya

Tetsuya Matsui from Hitachi, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2019-06-27
US20190195830A1
Physics

Ultrasonic inspection system

#2 | 2013-06-27
US20130160552A1
Physics

Internal defect inspection method and apparatus for the same

#3 | 2013-01-03
US20130003038A1
Physics

Distance measuring device and distance measuring method

#4 | 2012-11-15
US20120291161A1
Physics

Cantilever for magnetic force microscope and method of manufacturing the same

#5 | 2011-11-24
US20110286001A1
Physics

Dark-field defect inspecting method, dark-field defect inspecting apparatus, aberration analyzing method, and aberration analyzing apparatus

#6 | 2010-04-08
US20100085043A1
Physics

Eddy current testing apparatus and eddy current testing method

#7 | 2010-04-08
US20100085042A1
Physics

Eddy current testing method

#8 | 2009-05-14
US20090120192A1
Physics

Ultrasonic testing apparatus for turbine forks and method thereof

#9 | 2008-05-29
US20080123079A1
Physics

Residual stress measuring method and system

#10 | 2008-04-03
US20080079426A1
Physics

EDDY CURRENT TESTING APPARATUS AND EDDY CURRENT TESTING METHOD

#11 | 2008-02-14
US20080040148A1
Physics

Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method

#12 | 2008-01-17
US20080015732A1
Physics

Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method

#13 | 2008-01-17
US20080015731A1
Physics

Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method

#14 | 2007-03-15
US20070061044A1
Physics

Method and system for comprehensive management of chemical materials

#15 | 2007-02-06
US10780751
-

Nondestructive inspection apparatus and nondestructive inspection method using elastic guided wave

#16 | 2006-08-15
US9796066
-

Chemical material integrated management system and method thereof

#17 | 2006-08-03
US20060170420A1
Physics

Eddy current testing probe and eddy current testing apparatus

#18 | 2006-01-19
US20060015212A1
Physics

Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method

#19 | 2005-12-27
US10884983
-

Chemical substance total management system, storage medium storing chemical substance management program and chemical substance total management method

#20 | 2005-10-25
US10696564
-

Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection method

#21 | 2005-08-25
US20050183505A1
Physics

Ultrasonic flaw detecting method and ultrasonic flaw detector

#22 | 2005-08-23
US9858478
-

Method and system for comprehensive management of chemical materials

#23 | 2005-05-10
US10097376
-

Electronic exposure dose meter and radiation handling operation management system employing the same

InventorID:

7154 ⎘