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Inventor profile of:

Shree Nayar

City:

New York, New York

Country:

United States

Published Applications:

Last publication date:

2018-04-05

Top Assignees for applications by Shree Nayar

The entities that hold a legal rights for patent applications filed by inventor Nayar Shree:

OMRON CORPORATION 3 Kyoto, Japan
OMRON CORPORATION 3 Kyoto-shi, Japan
The Trustees of Columbia University in the City of New York 2 New York, NY United States
FotoNation Cayman Limited 2 San Jose, CA United States
OMRON CORPORATION 1 Kyoto-shi, Kyoto, Japan
Mitsubishi Electric Research Laboratories, Inc. 1 Cambridge, MA United States
Pelican Imaging Corporation 1 Mountain View, CA United States
FotoNation Limited 1 Galway, Ireland

Recent patent applications by Nayar Shree

Shree Nayar from New York, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2018-04-05

US20180097993A1

Electricity

Systems and methods for controlling aliasing in images captured by an array camera for use in super resolution processing using pixel apertures

#2 | 2016-10-27

US20160316140A1

Electricity

Systems and methods for controlling aliasing in images captured by an array camera for use in super resolution processing using pixel apertures

#3 | 2016-03-03

US20160065945A1

Electricity

SYSTEMS, METHODS, AND MEDIA FOR GENERATING STRUCTURED LIGHT

#4 | 2014-04-10

US20140098266A1

Electricity

SYSTEMS AND METHODS FOR CONTROLLING ALIASING IN IMAGES CAPTURED BY AN ARRAY CAMERA FOR USE IN SUPER RESOLUTION PROCESSING USING PIXEL APERTURES

#5 | 2012-04-12

US20120087566A1

Physics

Apparatus and method for inspecting surface state

#6 | 2012-04-12

US20120086950A1

Physics

Shape measuring apparatus and shape measuring method

#7 | 2012-02-23

US20120044504A1

Physics

Profilometer, measuring apparatus, and observing apparatus

#8 | 2010-10-14

US20100259746A1

Physics

PROFILOMETER

#9 | 2007-11-22

US20070268363A1

Physics

System and method for sensing geometric and photometric attributes of a scene with multiplexed illumination and solid states optical devices

#10 | 2005-06-23

US20050134599A1

Physics

Methods and systems for compensating an image projected onto a surface having spatially varying photometric properties

#11 | 2005-04-07

US20050073682A1

Physics

Systems and methods for modeling the impact of a medium on the appearances of encompassed light sources

InventorID:

717841 ⎘