Jin An

City:

Shanghai

Country:

China

Published Applications:

Last publication date:

2013-01-03

Top Assignees for applications by Jin An

The entities that hold a legal rights for patent applications filed by inventor An Jin:

Jin An from Shanghai, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

System and method for nondestructively measuring concentration and thickness of doped semiconductor layers

InventorID:

7191 ⎘