San Jose, California
United States
9
2010-09-28
The entities that hold a legal rights for patent applications filed by inventor Van Phuc:
Phuc Van from San Jose, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Non contact method and apparatus for measurement of sheet resistance of P-N junctions
#2 | 2010-06-22Non contact method and apparatus for measurement of sheet resistance of p-n junctions
#3 | 2010-06-15Non contact method and apparatus for measurement of sheet resistance of P-N junctions
#4 | 2010-06-15Non contact method and apparatus for measurement of sheet resistance of P-N junctions
#5 | 2009-03-10Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materials
#6 | 2008-04-22Non contact method and apparatus for measurement of sheet resistance of P-N junctions
#7 | 2006-10-03Determining thickness of slabs of materials by inventors
#8 | 2006-03-28Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctions
#9 | 2005-07-26Determination of minority carrier diffusion length in solid state materials
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