David W. Stein

City:

Concord, Massachusetts

Country:

United States

Published Applications:

Last publication date:

2007-08-28

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David W. Stein from Concord, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Method and system for detecting anomalies in multispectral and hyperspectral imagery employing the normal compositional model

Method and system for detecting targets known up to a simplex from multi-spectral and hyper-spectral imagery employing the normal compositional model

InventorID:

7297864 ⎘