Stefan Schulte

City:

Aalen

Country:

Germany

Published Applications:

Last publication date:

2007-05-01

Top Assignees for applications by Stefan Schulte

The entities that hold a legal rights for patent applications filed by inventor Schulte Stefan:

CARL ZEISS SMT AG 2 Oberkochen, Germany

Recent patent applications by Schulte Stefan

Stefan Schulte from Aalen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2007-05-01

US10299030

Interferometric measurement device for determining the birefringence in a transparent object

#2 | 2006-02-21

US10743792

Interferometer system and method for recording an interferogram using weighted averaging over multiple frequencies, and method for providing and manufacturing an object having a target surface

InventorID:

7319220 ⎘