Inventor profile of:

Sandeep Kumar Goel

City:

HsinChu

Country:

Taiwan

Published Applications:

19

Last publication date:

2025-10-23

Top Assignees for applications by Sandeep Kumar Goel

The entities that hold a legal rights for patent applications filed by inventor Kumar Goel Sandeep:

Recent patent applications by Kumar Goel Sandeep

Sandeep Kumar Goel from HsinChu, TW has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-10-23
US20250327854A1
Physics

METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM

#2 | 2025-10-02
US20250307513A1
Physics

SYSTEM AND METHOD FOR ESL MODELING OF MACHINE LEARNING

#3 | 2025-06-12
US20250190663A1
Physics

METHOD AND SYSTEM FOR REDUCING MIGRATION ERRORS

#4 | 2025-03-27
US20250103786A1
Physics

SYSTEMS AND METHODS FOR IMPLEMENTING INTEGRATED CIRCUIT DESIGN

#5 | 2025-01-16
US20250020719A1
Physics

Scan chains with multi-bit cells and methods for testing the same

#6 | 2024-10-10
US20240338506A1
Physics

SYSTEM AND METHOD FOR ESL MODELING OF MACHINE LEARNING

#7 | 2024-03-21
US20240094281A1
Physics

METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM

#8 | 2023-11-23
US20230376660A1
Physics

Integrated circuit design method, system and computer program product

#9 | 2023-11-02
US20230351081A1
Physics

Method and system for reducing migration errors

#10 | 2023-01-05
US20230003790A1
Physics

Method of testing an integrated circuit and testing system

#11 | 2022-09-22
US20220300689A1
Physics

Integrated circuit design method, system and computer program product

#12 | 2022-05-05
US20220138385A1
Physics

Integrated circuit design method, system and computer program product

#13 | 2021-10-21
US20210326502A1
Physics

Method and system for reducing migration errors

#14 | 2021-03-25
US20210089696A1
Physics

System and method for ESL modeling of machine learning

#15 | 2020-10-01
US20200311329A1
Physics

Power-aware scan partitioning

#16 | 2020-03-05
US20200072901A1
Physics

Fault diagnostics

#17 | 2019-04-18
US20190113573A1
Physics

Systems and methods for determining systematic defects

#18 | 2019-03-28
US20190094303A1
Physics

Power-aware scan partitioning

#19 | 2014-04-24
US20140111243A1
Physics

Transition delay detector for interconnect test

InventorID:

734157 ⎘