Lothar Pfitzner

City:

Erlangen

Country:

Germany

Published Applications:

Last publication date:

2006-11-07

Top Assignees for applications by Lothar Pfitzner

The entities that hold a legal rights for patent applications filed by inventor Pfitzner Lothar:

Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V 3 Munich, Germany
Infineon Technologies AG 2 Munich, Germany
Hungarian Academy of Sciences Research Institute for Technical Physics and Materials Science 1 Budapest, Hungary
Semiconductor 300 GmbH & Co. KG 1 Dresden, Germany
Fraunhofer-Gesellschaft zur Foerderung der angewandten forschung e. V. 1 Munich, Germany

Recent patent applications by Pfitzner Lothar

Lothar Pfitzner from Erlangen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2006-11-07

US10814252

Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces

#2 | 2006-02-21

US10233878

Particle measurement configuration and semiconductor wafer processing device with such a configuration

#3 | 2006-02-21

US9873230

Method and device for optically monitoring fabrication processes of finely structured surfaces in a semiconductor production

#4 | 2005-08-16

US10233901

Configuration for determining a concentration of contaminating particles in a loading and unloading chamber of an appliance for processing at least one disk-like object

InventorID:

7389427 ⎘