Nehal Dantwala

City:

Peekskill, New York

Country:

United States

Published Applications:

Last publication date:

2006-10-10

Top Assignees for applications by Nehal Dantwala

The entities that hold a legal rights for patent applications filed by inventor Dantwala Nehal:

Nehal Dantwala from Peekskill, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for deriving an objective sharpness metric

Cost function to measure objective quality for sharpness enhancement functions

InventorID:

7394388 ⎘