Austin, Texas
United States
4
2005-10-11
The entities that hold a legal rights for patent applications filed by inventor Bailey Todd:
Todd Bailey from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography
#2 | 2005-07-26High-resolution overlay alignment methods for imprint lithography
#3 | 2005-07-19High resolution overlay alignment systems for imprint lithography
#4 | 2005-07-12Method of varying template dimensions to achieve alignment during imprint lithography
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