Shuichi Takeuchi

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2024-05-23

Top Assignees for applications by Shuichi Takeuchi

The entities that hold a legal rights for patent applications filed by inventor Takeuchi Shuichi:

Shuichi Takeuchi from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device

Charged particle device and wiring method

Ion milling apparatus and ion milling method

Charged particle device and wiring method

SAMPLE PREPARATION APPARATUS, SAMPLE PREPARATION METHOD, AND CHARGED PARTICLE BEAM APPARATUS USING THE SAME

Optical disc drive and objective lens for the same

Diffractive lens and scanning lens formed with diffractive lens

InventorID:

750357 ⎘