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Inventor profile of:

Nir BILLFELD

City:

Kiryat Ata

Country:

Israel

Published Applications:

1

Last publication date:

2025-08-21

Recent patent applications by BILLFELD Nir

Nir BILLFELD from Kiryat Ata, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-08-21

US20250264814A1

OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUCTOR WAFERS

InventorID:

7515699 ⎘