Tokyo
Japan
45
2026-06-11
The entities that hold a legal rights for patent applications filed by inventor Li Wen:
Wen Li from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
HIGH-VOLTAGE POWER SUPPLY
#2 | 2025-09-18CHARGED PARTICLE BEAM DEVICE AND SUBSTRATE DETACHING METHOD
#3 | 2025-08-21Switching Power Supply Circuit and Electronic Device Including Switching Power Supply Circuit
#4 | 2024-07-04HIGH VOLTAGE AMPLIFIER
#5 | 2024-01-11CHARGED PARTICLE BEAM APPARATUS
#6 | 2023-10-19CHARGED PARTICLE BEAM APPARATUS AND PROCESSOR SYSTEM
#7 | 2023-02-23Measurement system and method of setting parameter of charged particle beam device
#8 | 2023-02-02CHARGED PARTICLE BEAM SCANNING MODULE, CHARGED PARTICLE BEAM DEVICE, AND COMPUTER
#9 | 2023-01-12CHARGED PARTICLE BEAM DEVICE
#10 | 2022-10-06Power supply module and charged particle beam device
#11 | 2022-08-25CHARGED PARTICLE BEAM DEVICE
#12 | 2022-08-04Charged particle beam device and charged particle beam device calibration method
#13 | 2022-06-16Charged particle beam device and operation method therefor
#14 | 2022-06-16Charged particle beam device, computer, and signal processing method for charged particle beam device
#15 | 2022-03-31Charged particle beam device
#16 | 2022-03-03Measurement device and signal processing method
#17 | 2022-03-03Charged particle beam device and power supply device
#18 | 2022-02-24Charged particle beam device
#19 | 2022-02-03Charged particle beam device and method of measuring electrical noise
#20 | 2021-04-01Power converter and control method of power converter that reduce ringing
#21 | 2021-03-04Charged particle beam control device
#22 | 2020-07-09Charged particle beam device
#23 | 2020-03-19Charged particle beam system
#24 | 2020-02-06Charged particle beam device
#25 | 2020-01-16Charged-particle beam system
#26 | 2019-12-12Charged particle beam control device
#27 | 2019-11-07Charged particle beam device and charged particle beam device noise source determination method
#28 | 2019-10-17Measurement and inspection device
#29 | 2018-12-20High voltage power supply device and charged particle beam device
#30 | 2018-08-30Charged particle beam device and image forming method using same
#31 | 2018-04-19Charged particle beam device with transient signal correction during beam blanking
#32 | 2018-01-04Circuit design system and circuit design method
#33 | 2017-10-26Clock control circuit, demodulation device and spread spectrum method
#34 | 2017-09-21Charged particle beam device
#35 | 2017-09-07High-sensitivity sensor system, detection circuit, and detection method
#36 | 2017-07-20Charged particle beam apparatus and image forming method of charged particle beam apparatus
#37 | 2016-11-10Charged particle beam device
#38 | 2016-09-22Charged particle beam apparatus, image forming method using a charged particle beam apparatus, and image processing apparatus
#39 | 2016-07-21Weak signal detection system and electron microscope equipped with same
#40 | 2016-03-03Charged particle beam apparatus and image generation method
#41 | 2015-12-24Measurement and inspection device
#42 | 2015-12-24Electromagnetic wave measuring apparatus and electromagnetic wave measuring method
#43 | 2015-02-12Processing apparatus and method using a scanning electron microscope
#44 | 2015-01-08Minute Signal Detection Method and System
#45 | 2014-05-08Driver integrated circuit
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