David Feiler

City:

Los Altos, California

Country:

United States

Published Applications:

Last publication date:

2014-05-08

Top Assignees for applications by David Feiler

The entities that hold a legal rights for patent applications filed by inventor Feiler David:

David Feiler from Los Altos, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Film thickness, refractive index, and extinction coefficient determination for film curve creation and defect sizing in real time

InventorID:

752250 ⎘