Tokyo
Japan
19
2024-05-16
The entities that hold a legal rights for patent applications filed by inventor Nakamura Mitsuhiro:
Mitsuhiro Nakamura from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Sample Holder and Electron Microscope
#2 | 2024-03-14Thin film damage detection function and charged particle beam device
#3 | 2024-03-07Sample holder, intermembrane distance adjustment mechanism, and charged particle beam device
#4 | 2023-08-17Charged Particle Beam Device and Scan Waveform Generation Method
#5 | 2023-06-22Charged Particle Beam Device and Sample Observation Method
#6 | 2022-02-10Charged particle beam device, autofocus processing method of charged particle beam device, and detector
#7 | 2021-01-21Charged particle beam apparatus
#8 | 2020-04-09Measuring apparatus and method of setting observation condition
#9 | 2016-07-14Charged particle beam device and charged particle beam device control method
#10 | 2014-05-08ADHESIVE COMPOSITION USED IN A MEDICAL INSTRUMENT AND ENDOSCOPE DEVICE
#11 | 2012-04-05ENDOSCOPIC DEVICE
#12 | 2011-04-21Information processing apparatus, communication apparatus, and program
#13 | 2011-03-31Communication device, communication method, information processing device, information processing method, program, and communication system
#14 | 2009-12-10INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, PROGRAM AND COMMUNICATION SYSTEM
#15 | 2007-12-13APPARATUS, INFORMATION PROCESSING APPARATUS, MANAGEMENT METHOD, AND INFORMATION PROCESSING METHOD
#16 | 2007-12-13Management apparatus, information processing apparatus, management method, and information processing method
#17 | 2007-02-13Computer program copy management system
#18 | 2006-11-16Data collection device, program, and data collection method
#19 | 2006-03-09Information processing apparatus and method, program, and recording medium
755504 ⎘