Scott Jessen

City:

Allen, Texas

Country:

United States

Published Applications:

Last publication date:

2026-03-26

Recent patent applications by Jessen Scott

Scott Jessen from Allen, US has applied for patents for these inventions. The list has both pending applications and granted patents:

PHOTOLITHOGRAPHIC MASK PATTERN GENERATION WITH OPTICAL PROXIMITY CORRECTION RULES DETERMINED USING SCATTERED DATA INTERPOLATION

PHOTOLITHOGRAPHIC MASKS AND DEVICES FABRICATED THEREFROM

PHOTOLITHOGRAPHIC MASK PATTERN ADJUSTMENT AND DEVICES FABRICATED THEREFROM

InventorID:

7568373 ⎘