Inventor profile of:

Marc S. Levoy

City:

Stanford, California

Country:

United States

Published Applications:

18

Last publication date:

2016-03-03

Top Assignees for applications by Marc S. Levoy

The entities that hold a legal rights for patent applications filed by inventor Levoy Marc S.:

Recent patent applications by Levoy Marc S.

Marc S. Levoy from Stanford, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2016-03-03
US20160062100A1
Physics

Light-field microscopy with phase masking

#2 | 2015-11-12
US20150326848A1
Electricity

Variable imaging arrangements and methods therefor

#3 | 2015-09-22
US14300959
Electricity

Systems and methods for push-button slow motion

#4 | 2015-06-04
US20150156402A1
Electricity

Imaging arrangements and methods therefor

#5 | 2014-09-18
US20140263963A1
Physics

Optics apparatus with detection of light rays received at different angles for output indicative of aliased views

#6 | 2014-07-24
US20140204184A1
Electricity

Variable imaging arrangements and methods therefor

#7 | 2014-02-20
US20140049663A1
Electricity

Imaging arrangements and methods therefor

#8 | 2013-07-04
US20130169855A1
Electricity

Imaging arrangements and methods therefor

#9 | 2013-05-02
US20130107085A1
Electricity

Correction of Optical Aberrations

#10 | 2013-02-07
US20130033626A1
Electricity

Variable imaging arrangements and methods therefor

#11 | 2012-11-29
US20120300097A1
Electricity

Variable imaging arrangements and methods therefor

#12 | 2012-09-13
US20120229682A1
Electricity

Correction of optical abberations

#13 | 2012-01-26
US20120019712A1
Electricity

Imaging arrangements and methods therefor

#14 | 2012-01-26
US20120019711A1
Electricity

Imaging arrangements and methods therefor

#15 | 2010-02-04
US20100026852A1
Physics

Variable imaging arrangements and methods therefor

#16 | 2009-05-21
US20090128669A1
Physics

Correction of optical aberrations

#17 | 2008-10-30
US20080266655A1
Physics

Microscopy arrangements and approaches

#18 | 2007-11-01
US20070252074A1
Electricity

Imaging arrangements and methods therefor

InventorID:

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