Inventor profile of:

Su Jin LEE

City:

Daegu

Country:

South Korea

Published Applications:

31

Last publication date:

2026-01-01

Top Assignees for applications by Su Jin LEE

The entities that hold a legal rights for patent applications filed by inventor LEE Su Jin:

Recent patent applications by LEE Su Jin

Su Jin LEE from Daegu, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-01-01
US20260005022A1
Electricity

SPIN ON CARBON HARDMASK COMPOSITIONS WITH LOW EVAPORATION LOSS AND PATTERNING METHOD BY USING THE SAME

#2 | 2025-12-18
US20250383599A1
Physics

CHEMICALLY AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR IMPROVING PATTERN PROFILE AND RESOLUTION

#3 | 2025-07-24
US20250236813A1
Chemistry; metallurgy

RINSE SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMATION METHOD USING SAME

#4 | 2025-06-19
US20250199406A1
Physics

CHEMICALLY AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR IMPROVING PATTERN PROFILE AND ENHANCING ADHESION

#5 | 2025-06-19
US20250199405A1
Physics

CHEMICALLY-AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR PATTERN PROFILE IMPROVEMENT AND ETCH RESISTANCE ENHANCEMENT

#6 | 2025-01-09
US20250013154A1
Physics

SPIN-ON CARBON HARD MASK COMPOSITION WITH HIGH PLANARIZATION PERFORMANCE AND PATTERNING METHOD USING SAME

#7 | 2023-11-02
US20230350293A1
Physics

I-LINE NEGATIVE PHOTORESIST COMPOSITION FOR REDUCING HEIGHT DIFFERENCE BETWEEN CENTER AND EDGE AND REDUCING LER, AND I-LINE NEGATIVE PHOTORESIST COMPOSITION FOR IMPROVING PROCESS MARGIN

#8 | 2023-08-24
US20230266672A1
Physics

PROCESS SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMING METHOD USING SAME

#9 | 2022-10-27
US20220342313A1
Physics

PROCESS LIQUID COMPOSITION FOR PHOTOLITHOGRAPHY AND PATTERN FORMING METHOD USING SAME

#10 | 2022-08-11
US20220251472A1
Chemistry; metallurgy

PROCESS LIQUID COMPOSITION FOR LITHOGRAPHY AND PATTERN FORMING METHOD USING SAME

#11 | 2022-06-09
US20220179318A1
Physics

Highly thick spin-on-carbon hard mask composition and patterning method using same

#12 | 2022-06-02
US20220172955A1
Electricity

Etching pattern forming method in semiconductor manufacturing process

#13 | 2022-03-31
US20220102158A1
Electricity

Method for forming silicon or silicon compound pattern in semiconductor manufacturing process

#14 | 2022-01-13
US20220011673A1
Physics

Process liquid for extreme ultraviolet lithography and pattern forming method using same

#15 | 2021-10-28
US20210333709A1
Physics

Organic-inorganic hybrid photoresist processing liquid composition

#16 | 2021-07-15
US20210216013A1
Physics

Chemically amplified positive photoresist composition for improving pattern profile

#17 | 2021-07-15
US20210214649A1
Chemistry; metallurgy

Process solution composition for extreme ultraviolet lithography, and method for forming pattern by using same

#18 | 2021-03-25
US20210088910A1
Physics

Process liquid composition for extreme ultraviolet lithography and pattern forming method using same

#19 | 2021-03-18
US20210082701A1
Electricity

Etching method for forming micro silicon pattern in semiconductor manufacturing process

#20 | 2021-03-04
US20210063887A1
Physics

EUV developer composition for forming photosensitive photoresist micropattern

#21 | 2020-11-19
US20200363724A1
Physics

Developer composition, for EUV light source, for forming photosensitive photoresist micropattern

#22 | 2020-06-11
US20200183284A1
Physics

Method and composition for improving LWR in patterning step using negative tone photoresist

#23 | 2020-04-09
US20200110339A1
Physics

Photoresist pattern shrinking composition and pattern shrinking method

#24 | 2019-08-22
US20190258163A1
Physics

High etch resistance spin-on carbon hard mask composition and patterning method using same

#25 | 2019-05-09
US20190137880A1
Physics

Method and composition for improving LWR in patterning step using negative tone photoresist

#26 | 2019-05-09
US20190137871A1
Physics

Chemically-amplified-type negative-type photoresist composition

#27 | 2019-04-04
US20190101827A1
Physics

Negative photoresist composition for KRF laser, having high resolution and high aspect ratio

#28 | 2018-08-16
US20180230334A1
Chemistry; metallurgy

Slurry composition for CMP and polishing method using same

#29 | 2018-07-19
US20180203351A1
Physics

Negative photoresist composition for KrF laser for forming semiconductor patterns

#30 | 2015-10-01
US20150274991A1
Chemistry; metallurgy

Coating composition for preventing collapse of capacitor

#31 | 2014-05-15
US20140135155A1
Human necessities

Apparatus, method, and system for controlling boomerang

InventorID:

763210 ⎘