Jena
Germany
2
2026-05-28
Stephan Ratzsch from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD AND SYSTEM FOR DETECTING DEFECTS IN A PHOTOLITHOGRAPHY MASK, FOR TRAINING A CORRESPONDING MACHINE LEARNING MODEL AND FOR GENERATING CORRESPONDING TRAINING DATA
#2 | 2025-11-27METHOD FOR CHARACTERIZING A MEASUREMENT APPARATUS FOR SEMICONDUCTOR LITHOGRAPHY AND MEASUREMENT APPARATUS
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